Definitive Reference For Indian Cent Die Varieties

DEFINITIVE REFERENCE FOR INDIAN CENT DIE VARIETIES

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1874 Variety 16


Obverse 17	Reverse P

Obverse Diagnostics

Date Position

Die Chips (Click Image To Enlarge)

Clash Marks

Obverse 17 Die Crack Mapping

Reverse Diagnostics

Curved Artifact At 2:00 (Click Image To Enlarge)

Die Chip at 2:30 (Click Image To Enlarge)

Primary Die Crack (Click Image To Enlarge)

Clash Mark Through (C)ENT

Clash Marks Located Right Of Denomination

Reverse P Die Crack Mapping

Obverse 17 is identified by date placement at LH and numerous die chips located on the portrait. Obverse 17 has developed die cracking and has acquired clash marks from a clashing event with Reverse P.

Reverse P is rotated 5 degrees counter clockwise and may be identified by a curved artifact within the right wreath at 2:00 and a die chip located at 2:30. Reverse P has developed die cracking and has acquired clash marks from a clashing event with Obverse 17.

Comments: Reverse P has developed extensive die cracking, with the most severe die crack located between 1:15 and 2:45.

The Reverse P curved artifact located within the right wreath at 2:00 may have occurred during the creation of the Reverse P Working Die. A similar artifact is found on Reverse AB of the 1863 Variety 26 Die Pairing, though this artifact is located at 10:00 on the left wreath.

Obverse 17 will later be in service paired with Reverse Q during the 1874 Variety 17 Die Pairing. The pairing of Obverse 17 and Reverse Q may have been the result of the retirement of Reverse P due to the development of a break between 1:15 and 2:45 during a subsequent die state.

Plate Coin: Courtesy of David Killough Collection, AU Details